Fizeau Interferometry
Fizeau interferometric fringes allow measurements of the evaporative thin film thickness with an accuracy of less than 100nm when a monochromatic light source is used. The working principle is based on the interference of the double reflected rays, one from the solid-liquid interface and the other from the liquid-vapor interface, and the interference images from totally destructive (darkest point) to totally constructive (brightest point) depending on the liquid film thickness that creates the optical path difference between the two-rays.
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